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HABT 100-V/SP20

Open Loop transducer using the Hall effect sensor

LEM | HAB-Series | Open Loop Transducer | Busbar Mount

± 100 ANominal Primary Current
4.5 .. 5.5 VPower Supply
Open Loop TransducerTechnology
± 0.5 % (up to 80 A) / ± 1 % (up to 100 A)Linearity Error (Max)
−30 .. 90 °COperating Temperature

Additional Technical Details

View Full Specifications
Current Consumption (IC)5 .. 10 mA
Sensitivity20 mV/A
Load Resistance (RL)9 .. 100 kOhm
Insulation Resistance (RINS)10 MOhm
Overall accuracy @ IP = 0 A± 0.7 %
Output Clamping Voltage Low5.1 .. 6.9 % UC

Standards & Approvals

Typical Applications

Temperature measurement by embedded NTC

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Product Description

The HABT 100-V/SP20 is an open loop current transducer from LEM delivering a output short-circuit duration (tc) of 2 min.

It offers excellent accuracy and very good linearity. Typical applications include Temperature measurement by embedded NTC.

Technical Specifications

General Information
ManufacturerLEM
Product SeriesHAB
Product ReferenceHABT 100-V/SP20
Primary Nominal Current± 100 A
Supply Voltage4.5 .. 5.5 V
Measurement—
Mounting—
Application DomainAutomotive applications
Absolute Maximum Ratings
Nominal supply voltage (UC)4.5 .. 5.5 V
Supply continuous over voltage8.5 V
Reverse voltage (Urev)−14 V
Over voltage (UO)14 V
Continuous output voltage (V_out)14 V
Continuous output current (I_out)−10 .. 10 mA
Output short-circuit duration (tc)2 min
Insulation resistance (RINS)10 MOhm
Ambient storage temperature (Tst)−40 .. 100 °C
Electrical Data
Supply voltage (UC)4.5 .. 5.5 V
Continuous output current (I_out)−1 .. 1 mA
Sensitivity error (εG)± 0.5 %
Load resistance (RL)9 .. 100 kOhm
Capacitive loading (C_L)10 .. 100 nF
Ambient operating temperature (TA)−30 .. 90 °C
Output voltage (diagnostic detection open ground)0.15 V
Output voltage (diagnostic detection open UC)0.15 V
Accuracy & Dynamic Performance
Current consumption (IC)5 .. 10 mA
Linearity error (εL) up to 80 A−0.5 .. 0.5 %
Linearity error (εL) up to 100 A−1 .. 1 %
Overall accuracy @ IP = 0 A± 0.7 %
Overall accuracy @ IP = 100 A± 3.75 %
Sensitivity (G)20 mV/A
Global offset current (I_O)± 300 mA
Electrical offset current (IOE)± 250 mA
Magnetic offset current (IOM)± 200 mA
Primary current, measuring range (IPM)± 100 A
Output voltage @ IP = 02.5 V (UC / 2)
Resolution2.5 mV
Output internal resistance (Rout)1 .. 10 Ohm
Step response time to 90 % I_PN1.1 µs
Power up time (t_r)25 .. 200 µs
Settling time after overload25 µs
NTC resistance (RNTC)2.178 .. 2.222 kOhm
B 25/85 constant3485 .. 3555
Output clamping voltage low5.1 .. 6.9 % UC
Output clamping voltage high92.1 .. 93.9 % UC
Temperature accuracy± 2 °C
Mechanical Characteristics
Plastic casePBT-GF30
Magnetic coreFerromagnetic alloy
PinsGold plated

Note: Specifications are taken from the official HABT 100-V/SP20 datasheet. Parameters that could not be confirmed from the datasheet are marked UNVERIFIED.

Dimensions & Drawings

Outline dimensions, pin layout and connection diagrams of the HABT 100-V/SP20 are shown below.

HABT 100-V/SP20 outline dimensions and pin layout
Outline dimensions (in mm) and connection diagrams — source: LEM HABT 100-V/SP20 datasheet, page 2

Note: All dimensions are in millimetres. Refer to the official datasheet for the complete dimension drawing.

Typical Applications

Typical applications of the HABT 100-V/SP20.

Temperature measurement by embedded NTC

Characteristic Curves

Characteristic curve diagrams are not included in the HABT 100-V/SP20 datasheet; the relevant characteristics are the accuracy and dynamic performance data listed below.

Accuracy & Dynamic Characteristics
Sensitivity error (εG)± 0.5 %
Linearity error (εL) up to 80 A−0.5 .. 0.5 %
Linearity error (εL) up to 100 A−1 .. 1 %
Overall accuracy @ IP = 0 A± 0.7 %
Overall accuracy @ IP = 100 A± 3.75 %
Sensitivity (G)20 mV/A
Step response time to 90 % I_PN1.1 µs
Temperature accuracy± 2 °C
Reference Conditions
Ambient Temperature (TA)25 °C, unless otherwise noted
Output Load Resistance (RL)9 .. 100 kOhm

Note: For the full set of performance data, refer to the datasheet.

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